Damage Localization of Stacker’s Track Based on EEMD-EMD and DBSCAN Cluster Algorithms

标题
Damage Localization of Stacker’s Track Based on EEMD-EMD and DBSCAN Cluster Algorithms
作者
关键词
-
出版物
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 69, Issue 5, Pages 1981-1992
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2019-06-05
DOI
10.1109/tim.2019.2919375

向作者/读者发起求助以获取更多资源

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started