Bias-Dependent Electron Velocity Extracted From N-Polar GaN Deep Recess HEMTs

Title
Bias-Dependent Electron Velocity Extracted From N-Polar GaN Deep Recess HEMTs
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 67, Issue 4, Pages 1542-1546
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-02-29
DOI
10.1109/ted.2020.2973081

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