Bias-Dependent Electron Velocity Extracted From N-Polar GaN Deep Recess HEMTs

标题
Bias-Dependent Electron Velocity Extracted From N-Polar GaN Deep Recess HEMTs
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 67, Issue 4, Pages 1542-1546
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2020-02-29
DOI
10.1109/ted.2020.2973081

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