Demonstration of 3D Convolution Kernel Function Based on 8-Layer 3D Vertical Resistive Random Access Memory

Title
Demonstration of 3D Convolution Kernel Function Based on 8-Layer 3D Vertical Resistive Random Access Memory
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 41, Issue 3, Pages 497-500
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-01-31
DOI
10.1109/led.2020.2970536

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now