4.6 Article

Monolithic 3D Integration of InGaAs Photodetectors on Si MOSFETs Using Sequential Fabrication Process

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 41, Issue 3, Pages 433-436

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2020.2966986

Keywords

Monolithic integration; InGaAs imager; high-resolution imaging

Funding

  1. National Research Foundation of Korea (NRF) - Ministry of Science and ICT (MSIT) [2016910562, 201901074452, 201902072072, 201902071513]
  2. KAIST Startup Funding [G04180061]
  3. NNFC OI LAB Project
  4. BK21 Plus
  5. G-CORE [N11200014]
  6. National Research Foundation of Korea [2016M3A7B4910426] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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We demonstrated the monolithic 3D (M3D) integration of InGaAs photodetectors (PDs) on silicon-on-insulator metal-oxide-semiconductor field-effect transistors (SOI-MOSFETs) by the sequential process of InGaAs PDs on pre-fabricated SOI-MOSFETs. InGaAs PDs and SOI MOSFETs showed their original performances after integration and sequential process thanks to the low-temperature process. In addition, the integrated devices successfully performed the fundamental readout circuit operation such as direct injection and source follower per detector (SFD) by connecting transistors (Trs) and PDs. By illuminating 1550 nm laser on InGaAs PDs, the different behaviors of output voltages were clearly obtained according to the Tr's on/off state. From these results, we believe that this monolithic 3D integration method could be a feasible approach toward high-resolution multicolor imaging systems.

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