Near Threshold Capacitance Matching in a Negative Capacitance FET With 1 nm Effective Oxide Thickness Gate Stack

Published 2019 View Full Article

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Title
Near Threshold Capacitance Matching in a Negative Capacitance FET With 1 nm Effective Oxide Thickness Gate Stack
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 41, Issue 1, Pages 179-182
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-11-06
DOI
10.1109/led.2019.2951705

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