Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations

Title
Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 23, Pages 232102
Publisher
AIP Publishing
Online
2019-12-02
DOI
10.1063/1.5127259

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