Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations
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Title
Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 23, Pages 232102
Publisher
AIP Publishing
Online
2019-12-02
DOI
10.1063/1.5127259
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