Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations
出版年份 2019 全文链接
标题
Optical probing of extended defects in CdTe virtual substrates via isolated emitters produced by weakly perturbed fragments of partial dislocations
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 115, Issue 23, Pages 232102
出版商
AIP Publishing
发表日期
2019-12-02
DOI
10.1063/1.5127259
参考文献
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