QTL analysis and fine mapping of a QTL for yield-related traits in wheat grown in dry and hot environments

Title
QTL analysis and fine mapping of a QTL for yield-related traits in wheat grown in dry and hot environments
Authors
Keywords
-
Journal
THEORETICAL AND APPLIED GENETICS
Volume -, Issue -, Pages -
Publisher
Springer Science and Business Media LLC
Online
2019-10-05
DOI
10.1007/s00122-019-03454-6

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started