Stability and Reliability of Lateral GaN Power Field-Effect Transistors

Published 2019 View Full Article

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Title
Stability and Reliability of Lateral GaN Power Field-Effect Transistors
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 11, Pages 4578-4590
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-08-14
DOI
10.1109/ted.2019.2931718

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