Anomalously Beneficial Gate-Length Scaling Trend of Negative Capacitance Transistors

Title
Anomalously Beneficial Gate-Length Scaling Trend of Negative Capacitance Transistors
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 40, Issue 11, Pages 1860-1863
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-09-13
DOI
10.1109/led.2019.2940715

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