Experimental determination of critical adhesion energies with the Advanced Button Shear Test

Published 2019 View Full Article

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Title
Experimental determination of critical adhesion energies with the Advanced Button Shear Test
Authors
Keywords
Reliability, Adhesion, Critical adhesion energy, Interface delamination, Semiconductor package, Cohesive Zone Method
Journal
MICROELECTRONICS RELIABILITY
Volume 99, Issue -, Pages 177-185
Publisher
Elsevier BV
Online
2019-06-20
DOI
10.1016/j.microrel.2019.06.001

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