Optimal machine learning models for robust materials classification using ToF-SIMS data

Published 2019 View Full Article

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Title
Optimal machine learning models for robust materials classification using ToF-SIMS data
Authors
Keywords
Time-of-flight secondary ion mass spectrometry (ToF-SIMS), Multivariate analysis (MVA), Self-organising maps (SOMs), Materials informatics
Journal
APPLIED SURFACE SCIENCE
Volume 487, Issue -, Pages 773-783
Publisher
Elsevier BV
Online
2019-05-15
DOI
10.1016/j.apsusc.2019.05.123

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