Optimal machine learning models for robust materials classification using ToF-SIMS data

出版年份 2019 全文链接

标题

作者

关键词

Time-of-flight secondary ion mass spectrometry (ToF-SIMS), Multivariate analysis (MVA), Self-organising maps (SOMs), Materials informatics

出版物

Volume 487, Issue -, Pages 773-783

出版商

Elsevier BV

发表日期

2019-05-15

DOI

10.1016/j.apsusc.2019.05.123

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