Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis—Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering Rates

Title
Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis—Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering Rates
Authors
Keywords
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Journal
ANALYTICAL CHEMISTRY
Volume 91, Issue 18, Pages 11712-11722
Publisher
American Chemical Society (ACS)
Online
2019-08-20
DOI
10.1021/acs.analchem.9b02287

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