Scanner-Based Minirhizotrons Help to Highlight Relations between Deep Roots and Yield in Various Wheat Cultivars under Combined Water and Nitrogen Deficit Conditions

Title
Scanner-Based Minirhizotrons Help to Highlight Relations between Deep Roots and Yield in Various Wheat Cultivars under Combined Water and Nitrogen Deficit Conditions
Authors
Keywords
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Journal
Agronomy-Basel
Volume 9, Issue 6, Pages 297
Publisher
MDPI AG
Online
2019-06-07
DOI
10.3390/agronomy9060297

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