Atomic-scale observation of defects motion in van der Waals layered chalcogenide based materials

Published 2019 View Full Article

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Title
Atomic-scale observation of defects motion in van der Waals layered chalcogenide based materials
Authors
Keywords
van der Waals layered structures, Bilayer defect, Interfacial phase-change materials, Switching mechanism, In situ, electron microscopy
Journal
SCRIPTA MATERIALIA
Volume 166, Issue -, Pages 154-158
Publisher
Elsevier BV
Online
2019-03-28
DOI
10.1016/j.scriptamat.2019.03.024

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