Atomic-scale observation of defects motion in van der Waals layered chalcogenide based materials

出版年份 2019 全文链接

标题

作者

关键词

van der Waals layered structures, Bilayer defect, Interfacial phase-change materials, Switching mechanism, In situ, electron microscopy

出版物

Volume 166, Issue -, Pages 154-158

出版商

Elsevier BV

发表日期

2019-03-28

DOI

10.1016/j.scriptamat.2019.03.024

联系作者

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started