Band alignment of Ga2O3/Si heterojunction interface measured by X-ray photoelectron spectroscopy

Title
Band alignment of Ga2O3/Si heterojunction interface measured by X-ray photoelectron spectroscopy
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 109, Issue 10, Pages 102106
Publisher
AIP Publishing
Online
2016-09-10
DOI
10.1063/1.4962538

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