Abnormal positive bias stress instability of In–Ga–Zn–O thin-film transistors with low-temperature Al2O3 gate dielectric

Title
Abnormal positive bias stress instability of In–Ga–Zn–O thin-film transistors with low-temperature Al2O3 gate dielectric
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 108, Issue 3, Pages 033502
Publisher
AIP Publishing
Online
2016-01-21
DOI
10.1063/1.4939905

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