A Physics-Based Compact Model for CBRAM Retention Behaviors Based on Atom Transport Dynamics and Percolation Theory

Title
A Physics-Based Compact Model for CBRAM Retention Behaviors Based on Atom Transport Dynamics and Percolation Theory
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 40, Issue 4, Pages 647-650
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-02-27
DOI
10.1109/led.2019.2901754

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