A General Approach to Probe Dynamic Operation and Carrier Mobility in Field‐Effect Transistors with Nonuniform Accumulation
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Title
A General Approach to Probe Dynamic Operation and Carrier Mobility in Field‐Effect Transistors with Nonuniform Accumulation
Authors
Keywords
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Journal
ADVANCED FUNCTIONAL MATERIALS
Volume -, Issue -, Pages 1901700
Publisher
Wiley
Online
2019-05-23
DOI
10.1002/adfm.201901700
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