Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy

Title
Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy
Authors
Keywords
Ptychography, Differential phase contrast, Scanning transmission electron microscopy
Journal
ULTRAMICROSCOPY
Volume 197, Issue -, Pages 112-121
Publisher
Elsevier BV
Online
2018-12-18
DOI
10.1016/j.ultramic.2018.12.010

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