Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors

Published 2018 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors
Authors
Keywords
Insulator/semiconductor interface, Trap states, Cumulative charge, Organic thin film transistor
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 91, Issue -, Pages 275-280
Publisher
Elsevier BV
Online
2018-12-05
DOI
10.1016/j.mssp.2018.11.019

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.