Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors

出版年份 2018 全文链接

标题

作者

关键词

Insulator/semiconductor interface, Trap states, Cumulative charge, Organic thin film transistor

出版物

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Volume 91, Issue -, Pages 275-280

出版商

Elsevier BV

发表日期

2018-12-05

DOI

10.1016/j.mssp.2018.11.019

向作者/读者发起求助以获取更多资源

Protocol

在线求助

Reagent

在线求助

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More