Structural characterization and transistor properties of thickness-controllable MoS2 thin films

Title
Structural characterization and transistor properties of thickness-controllable MoS2 thin films
Authors
Keywords
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Journal
JOURNAL OF MATERIALS SCIENCE
Volume 54, Issue 10, Pages 7758-7767
Publisher
Springer Nature
Online
2019-02-16
DOI
10.1007/s10853-019-03435-6

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