Exploring the role of nitrogen incorporation in ZrO2 resistive switching film for enhancing the device performance

Title
Exploring the role of nitrogen incorporation in ZrO2 resistive switching film for enhancing the device performance
Authors
Keywords
RRAM, Nitrogen doping, Multilevel storage, Oxygen vacancy, First-principle method
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 775, Issue -, Pages 1301-1306
Publisher
Elsevier BV
Online
2018-10-23
DOI
10.1016/j.jallcom.2018.10.249

Ask authors/readers for more resources

Reprint

Contact the author

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started