Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes

Published 2019 View Full Article

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Title
Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume 11, Issue 12, Pages 11667-11673
Publisher
American Chemical Society (ACS)
Online
2019-03-05
DOI
10.1021/acsami.8b22217

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