Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes

标题
Direct Evidence of Ion-Migration-Induced Degradation of Ultrabright Perovskite Light-Emitting Diodes
作者
关键词
-
出版物
ACS Applied Materials & Interfaces
Volume 11, Issue 12, Pages 11667-11673
出版商
American Chemical Society (ACS)
发表日期
2019-03-05
DOI
10.1021/acsami.8b22217

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