A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis
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Title
A Bayesian approach to beam-induced motion correction in cryo-EM single-particle analysis
Authors
Keywords
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Journal
IUCrJ
Volume 6, Issue 1, Pages 5-17
Publisher
International Union of Crystallography (IUCr)
Online
2018-11-08
DOI
10.1107/s205225251801463x
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