High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy

Title
High-resolution noise substitution to measure overfitting and validate resolution in 3D structure determination by single particle electron cryomicroscopy
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 135, Issue -, Pages 24-35
Publisher
Elsevier BV
Online
2013-06-22
DOI
10.1016/j.ultramic.2013.06.004

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