A challenge for x-ray photoelectron spectroscopy characterization of Cu(In,Ga)Se2 absorbers: The accurate quantification of Ga/(Ga + In) ratio

Title
A challenge for x-ray photoelectron spectroscopy characterization of Cu(In,Ga)Se2 absorbers: The accurate quantification of Ga/(Ga + In) ratio
Authors
Keywords
Copper indium gallium selenide, X-ray photoelectron spectroscopy, Surface composition, Gallium, Indium, Surface chemical engineering
Journal
THIN SOLID FILMS
Volume 669, Issue -, Pages 425-429
Publisher
Elsevier BV
Online
2018-11-16
DOI
10.1016/j.tsf.2018.11.029

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