A challenge for x-ray photoelectron spectroscopy characterization of Cu(In,Ga)Se2 absorbers: The accurate quantification of Ga/(Ga + In) ratio

出版年份 2018 全文链接

标题

作者

关键词

Copper indium gallium selenide, X-ray photoelectron spectroscopy, Surface composition, Gallium, Indium, Surface chemical engineering

出版物

THIN SOLID FILMS

Volume 669, Issue -, Pages 425-429

出版商

Elsevier BV

发表日期

2018-11-16

DOI

10.1016/j.tsf.2018.11.029

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