FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

Published 2016 View Full Article

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Title
FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior
Authors
Keywords
Focused ion beam, Aluminum, Dislocations, Annealing, In–situ transmission electron microscopy, Slip bursts
Journal
ACTA MATERIALIA
Volume 110, Issue -, Pages 283-294
Publisher
Elsevier BV
Online
2016-03-24
DOI
10.1016/j.actamat.2016.03.017

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