Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity

Title
Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity
Authors
Keywords
Projected fringes, Profilometry, Edge detection, Systematic errors, Point spread function
Journal
OPTICS AND LASERS IN ENGINEERING
Volume 112, Issue -, Pages 68-76
Publisher
Elsevier BV
Online
2018-09-14
DOI
10.1016/j.optlaseng.2018.08.002

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