Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity

标题
Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity
作者
关键词
Projected fringes, Profilometry, Edge detection, Systematic errors, Point spread function
出版物
OPTICS AND LASERS IN ENGINEERING
Volume 112, Issue -, Pages 68-76
出版商
Elsevier BV
发表日期
2018-09-14
DOI
10.1016/j.optlaseng.2018.08.002

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