Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures

Published 2018 View Full Article

Authors

Keywords

Tin sulfide, Chemical bath deposition, Quantitative XPS, Thin films, Rietveld refinement, Deposition temperature

Journal

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Volume 89, Issue -, Pages 131-142

Publisher

Elsevier BV

Online

2018-09-18

DOI

10.1016/j.mssp.2018.09.009

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