Detailed characterization of good-quality SnS thin films obtained by chemical solution deposition at different reaction temperatures

出版年份 2018 全文链接

标题

作者

关键词

Tin sulfide, Chemical bath deposition, Quantitative XPS, Thin films, Rietveld refinement, Deposition temperature

出版物

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Volume 89, Issue -, Pages 131-142

出版商

Elsevier BV

发表日期

2018-09-18

DOI

10.1016/j.mssp.2018.09.009

向作者/读者发起求助以获取更多资源

Protocol

在线求助

Reagent

在线求助

Reprint

联系作者

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More