Wafer-level SLID bonding for MEMS encapsulation

Title
Wafer-level SLID bonding for MEMS encapsulation
Authors
Keywords
Micro electronic mechanical system (MEMS), Solid-liquid interdiffusion (SLID) bonding, Transient liquid-phase (TLP) bonding, Defects, Shear test, Reliability
Journal
Advances in Manufacturing
Volume 1, Issue 3, Pages 226-235
Publisher
Springer Nature
Online
2013-09-05
DOI
10.1007/s40436-013-0035-0

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