Exploring aberration-corrected electron microscopy for compound semiconductors

Seeing the atoms more clearly: STEM imaging from the Crewe era to today

(2012) S.J. Pennycook   ULTRAMICROSCOPY

Microstructural characterization of thick ZnTe epilayers grown on GaSb, InAs, InP and GaAs (100) substrates

(2011) Lu Ouyang et al.   JOURNAL OF CRYSTAL GROWTH

Electron microscopy at a sub-50 pm resolution

(2011) K. Takayanagi et al.   Microscopy

Aberration Correction and Electron Holography

(2010) Hannes Lichte et al.   MICROSCOPY AND MICROANALYSIS

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns

(2010) J. Barthel et al.   ULTRAMICROSCOPY

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

(2009) S. D. Findlay et al.   APPLIED PHYSICS LETTERS

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

(2009) Rolf Erni et al.   PHYSICAL REVIEW LETTERS

On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM

(2009) C.L. Jia et al.   ULTRAMICROSCOPY

MBE growth of II–VI materials on GaSb substrates for photovoltaic applications

(2008) S. Wang et al.   JOURNAL OF CRYSTAL GROWTH

Growth and properties of near-UV light emitting diodes based on InN/GaN quantum wells

(2008) E. Dimakis et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE