4.5 Article Proceedings Paper

Aberration Correction and Electron Holography

Journal

MICROSCOPY AND MICROANALYSIS
Volume 16, Issue 4, Pages 434-440

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927610093633

Keywords

aberration correction; electron holography; TEM; phase contrast; phase detection limit; signal-to-noise ratio; atomic resolution

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Electron holography has been shown to allow a posteriori aberration correction. Therefore, an aberration corrector in the transmission electron microscope does not seem to be needed with electron holography to achieve atomic lateral resolution. However, to reach a signal resolution sufficient for detecting single light atoms and very small interatomic fields, the aberration corrector has turned out to be very helpful. The basic reason is the optimized use of the limited number of coherent electrons that are provided by the electron source, as described by the brightness. Finally, quantitative interpretation of atomic structures benefits from the holographic facilities of fine-tuning of the aberration coefficients a posteriori and from evaluating both amplitude and phase.

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