Hot phonon and carrier relaxation in Si(100) determined by transient extreme ultraviolet spectroscopy
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Title
Hot phonon and carrier relaxation in Si(100) determined by transient extreme ultraviolet spectroscopy
Authors
Keywords
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Journal
Structural Dynamics
Volume 5, Issue 5, Pages 054302
Publisher
AIP Publishing
Online
2018-09-12
DOI
10.1063/1.5038015
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