Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution
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Title
Measurement of transient atomic displacements in thin films with picosecond
and femtometer resolution
Authors
Keywords
-
Journal
Structural Dynamics
Volume 1, Issue 3, Pages 034301
Publisher
AIP Publishing
Online
2014-05-07
DOI
10.1063/1.4875347
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