Kapitza conductance of Bi/sapphire interface studied by depth- and time-resolved X-ray diffraction

Published 2011 View Full Article

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Title
Kapitza conductance of Bi/sapphire interface studied by depth- and time-resolved X-ray diffraction
Authors
Keywords
-
Journal
SOLID STATE COMMUNICATIONS
Volume 151, Issue 11, Pages 826-829
Publisher
Elsevier BV
Online
2011-04-15
DOI
10.1016/j.ssc.2011.03.022

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