Two-photon instant structured illumination microscopy improves the depth penetration of super-resolution imaging in thick scattering samples

Title
Two-photon instant structured illumination microscopy improves the depth penetration of super-resolution imaging in thick scattering samples
Authors
Keywords
-
Journal
Optica
Volume 1, Issue 3, Pages 181
Publisher
The Optical Society
Online
2014-09-13
DOI
10.1364/optica.1.000181

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