Rietveld-based energy-dispersive residual stress evaluation: analysis of complex stress fields σij(z)

Sin2ψ-based residual stress gradient analysis by energy-dispersive synchrotron diffraction constrained by small gauge volumes. II. Experimental implementation

(2013) M. Meixner et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

(2013) Mario Stefenelli et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

(2012) J. Keckes et al.   SCRIPTA MATERIALIA

A two-dimensional waveguide beam for X-ray nanodiffraction

(2011) Christina Krywka et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

(2011) Ch Genzel et al.   JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN

The Race to X-ray Microbeam and Nanobeam Science

(2011) G. E. Ice et al.   SCIENCE

Rietveld refinement of energy-dispersive synchrotron measurements

(2011) Daniel Apel et al.   ZEITSCHRIFT FUR KRISTALLOGRAPHIE

Energy-dispersive diffraction stress analysis under laboratory and synchrotron conditions: a comparative study

(2010) Ch. Genzel et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Residual stress depth profiling in complex hard coating systems by X-ray diffraction

(2008) M. Klaus et al.   THIN SOLID FILMS