X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Authors

Keywords

Journal

Volume 46, Issue 5, Pages 1378-1385

Publisher

International Union of Crystallography (IUCr)

Online

2013-08-24

DOI

10.1107/s0021889813019535

References

View 5 related references

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started