Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach

Title
Sub-micrometre depth-gradient measurements of phase, strain and texture in polycrystalline thin films: a nano-pencil beam diffraction approach
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 47, Issue 2, Pages 495-504
Publisher
International Union of Crystallography (IUCr)
Online
2014-02-21
DOI
10.1107/s1600576714000557

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