Demonstration of thin film pair distribution function analysis (tfPDF) for the study of local structure in amorphous and crystalline thin films

Detection and characterization of nanoparticles in suspension at low concentrations using the X-ray total scattering pair distribution function technique

(2015) Maxwell W. Terban et al.   Nanoscale

On the estimation of statistical uncertainties on powder diffraction and small-angle scattering data from two-dimensional X-ray detectors

(2014) X. Yang et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions

(2013) P. Juhás et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Rietveld refinements performed on mesoporous ceria layers at grazing incidence

(2011) David Simeone et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Atomic Layer Deposition: An Overview

(2009) Steven M. George   CHEMICAL REVIEWS

Determination of the composition of Ultra-thin Ni-Si films on Si: constrained modeling of electron probe microanalysis and x-ray reflectivity data

(2008) Tran M. Phung et al.   X-RAY SPECTROMETRY