Structural and optical characterization of pure Si-rich nitride thin films

Published 2013 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Structural and optical characterization of pure Si-rich nitride thin films
Authors
Keywords
Silicon nitride, Silicon nanocrystals, Amorphous silicon nanoparticles, FTIR, Raman, XRD, Laser annealing, Photoluminescence
Journal
Nanoscale Research Letters
Volume 8, Issue 1, Pages 31
Publisher
Springer Nature
Online
2013-01-17
DOI
10.1186/1556-276x-8-31
References
View 3 related references

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.